Quality Factors Affecting Iris Segmentation and Matching
2013 (English)In: Proceedings – 2013 International Conference on Biometrics, ICB 2013 / [ed] Julian Fierrez, Ajay Kumar, Mayank Vatsa, Raymond Veldhuis & Javier Ortega-Garcia, Piscataway, N.J.: IEEE conference proceedings, 2013, article id 6613016Conference paper, Published paper (Refereed)
Abstract [en]
Image degradations can affect the different processing steps of iris recognition systems. With several quality factors proposed for iris images, its specific effect in the segmentation accuracy is often obviated, with most of the efforts focused on its impact in the recognition accuracy. Accordingly, we evaluate the impact of 8 quality measures in the performance of iris segmentation. We use a database acquired with a close-up iris sensor and built-in quality checking process. Despite the latter, we report differences in behavior, with some measures clearly predicting the segmentation performance, while others giving inconclusive results. Recognition experiments with two matchers also show that segmentation and matching performance are not necessarily affected by the same factors. The resilience of one matcher to segmentation inaccuracies also suggest that segmentation errors due to low image quality are not necessarily revealed by the matcher, pointing out the importance of separate evaluation of the segmentation accuracy. © 2013 IEEE.
Place, publisher, year, edition, pages
Piscataway, N.J.: IEEE conference proceedings, 2013. article id 6613016
Keywords [en]
Accuracy, Databases, Image edge detection, Image segmentation, Iris, Iris recognition, Motion segmentation
National Category
Signal Processing
Identifiers
URN: urn:nbn:se:hh:diva-21554DOI: 10.1109/ICB.2013.6613016ISI: 000334288200065Scopus ID: 2-s2.0-84887495558ISBN: 978-1-4799-0310-8 (electronic)OAI: oai:DiVA.org:hh-21554DiVA, id: diva2:607425
Conference
ICB-2013, The 6th IAPR International Conference on Biometrics, Madrid, Spain, June 4-7, 2013
Funder
EU, FP7, Seventh Framework Programme, 254261Swedish Research Council, Postdoctoral Grant 2009-7215
Note
IEEE Catalog Number: CFP1392R-ART
2013-02-222013-02-222025-10-01Bibliographically approved