hh.sePublications
Change search
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf
Sharp-Edge: A Robust Edge Computing Solution Through Performance Monitoring Using Tiny Machine Learning
Independent Researcher, Rockville, United States.
Halmstad University, School of Information Technology.ORCID iD: 0000-0002-2874-6256
North Carolina Agricultural and Technical State University, Greensboro, United States.ORCID iD: 0000-0003-2647-2797
2025 (English)In: Proceedings - International Symposium on Quality Electronic Design, ISQED, IEEE Computer Society, 2025, p. 1-7Conference paper, Published paper (Refereed)
Abstract [en]

Conventional reliability improvement methods might not be efficient solutions for Edge systems where limited hardware and processing resources are available. To address this gap, this paper proposes the application of performance monitoring metrics of the central processing unit used in Edge devices for reliability improvement purposes. We have utilized the performance monitoring toolset, PERF, along with the LLFI fault injection tool to inject a variety of fault models into a prototypical Edge processor while running Mibench benchmark programs. The injected faults are used to collect a dataset showcasing the behavior of the system under various reliability conditions. The collected dataset is then used to train machine learning models that can help with runtime monitoring and detection of possible fault situations on the Edge system. Our experiments show that trained models can achieve a high fault detection accuracy of 91.5%. Implementations of the tiny machine-learning models showed that we can keep accuracy above 90% while model summarization methods helped save more than 80% of the model parameters. © 2025 IEEE.

Place, publisher, year, edition, pages
IEEE Computer Society, 2025. p. 1-7
Series
Proceedings of the International Symposium on Quality Electronic Design, ISSN 1948-3287, E-ISSN 1948-3295
Keywords [en]
Edge Devices, Fault Detection, Machine Learning, Reliability, Tiny ML
National Category
Computer Systems Computer Sciences Communication Systems
Identifiers
URN: urn:nbn:se:hh:diva-56677DOI: 10.1109/ISQED65160.2025.11014445ISI: 001552227300111Scopus ID: 2-s2.0-105007532717ISBN: 979-8-3315-0942-2 (electronic)OAI: oai:DiVA.org:hh-56677DiVA, id: diva2:1983674
Conference
26th International Symposium on Quality Electronic Design, ISQED 2025, San Francisco, USA, Hybrid, April 23-25, 2025
Note

Funding: National Science Foundation (Grant Number: 2302537)

Available from: 2025-07-11 Created: 2025-07-11 Last updated: 2025-10-01Bibliographically approved

Open Access in DiVA

No full text in DiVA

Other links

Publisher's full textScopus

Authority records

Fazeli, Mahdi

Search in DiVA

By author/editor
Fazeli, MahdiPatooghy, Ahmad
By organisation
School of Information Technology
Computer SystemsComputer SciencesCommunication Systems

Search outside of DiVA

GoogleGoogle Scholar

doi
isbn
urn-nbn

Altmetric score

doi
isbn
urn-nbn
Total: 100 hits
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf