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Surface topography characterization using 3D stereoscopic reconstruction of SEM images
Halmstad University, School of Business, Engineering and Science, The Rydberg Laboratory for Applied Sciences (RLAS).ORCID iD: 0000-0002-8364-202x
Halmstad University, School of Business, Engineering and Science, The Rydberg Laboratory for Applied Sciences (RLAS).ORCID iD: 0000-0002-2330-0597
Halmstad University, School of Business, Engineering and Science, The Rydberg Laboratory for Applied Sciences (RLAS).ORCID iD: 0000-0001-8058-1252
2018 (English)In: Surface Topography: Metrology and Properties, ISSN 2051-672X, Vol. 6, no 2, article id 024006Article in journal (Refereed) Published
Abstract [en]

A major drawback of the optical microscope is its limitation to resolve finer details. Many microscopes have been developed to overcome the limitations set by the diffraction of visible light. The scanning electron microscope (SEM) is one such alternative: it uses electrons for imaging, which have much smaller wavelength than photons. As a result high magnification with superior image resolution can be achieved. However, SEM generates 2D images which provide limited data for surface measurements and analysis. Often many research areas require the knowledge of 3D structures as they contribute to a comprehensive understanding of microstructure by allowing effective measurements and qualitative visualization of the samples under study. For this reason, stereo photogrammetry technique is employed to convert SEM images into 3D measurable data. This paper aims to utilize a stereoscopic reconstruction technique as a reliable method for characterization of surface topography. Reconstructed results from SEM images are compared with coherence scanning interferometer (CSI) results obtained by measuring a roughness reference standard sample. This paper presents a method to select the most robust/consistent surface texture parameters that are insensitive to the uncertainties involved in the reconstruction technique itself. Results from the two-stereoscopic reconstruction algorithms are also documented in this paper. © 2018 IOP Publishing Ltd.

Place, publisher, year, edition, pages
Bristol: Institute of Physics (IOP), 2018. Vol. 6, no 2, article id 024006
Keywords [en]
Image resolution, Interferometers, Light, Photogrammetry, Power spectral density, Scanning, Scanning electron microscopy, Spectral density, Stereo image processing, Surface measurement, Surface topography, Three dimensional computer graphics, High magnifications, Reconstruction algorithms, Reconstruction techniques, Reference standard samples, Scanning interferometers, Stereophotogrammetry, Surface texture parameters, The scanning electron microscopes (SEM), Image reconstruction
National Category
Computer graphics and computer vision
Identifiers
URN: urn:nbn:se:hh:diva-38710DOI: 10.1088/2051-672X/aabde1ISI: 000432445700001Scopus ID: 2-s2.0-85051421851OAI: oai:DiVA.org:hh-38710DiVA, id: diva2:1276400
Available from: 2019-01-08 Created: 2019-01-08 Last updated: 2026-02-10Bibliographically approved
In thesis
1. On Characterization and Optimization of Surface Topography in Additive Manufacturing Processes
Open this publication in new window or tab >>On Characterization and Optimization of Surface Topography in Additive Manufacturing Processes
2022 (English)Doctoral thesis, comprehensive summary (Other academic)
Abstract [en]

With its ability to construct components through the layer-by-layer deposition of material, Additive Manufacturing (AM), more commonly known as "3D printing", has revolutionized the manufacturing industries. Not only can AM produce complex lightweight designs, but it can also streamline the supply chain, allowing businesses to more quickly and easily meet customer demand. Additionally, with the rising demand for low-volume customized products and sustainable production, manufacturers are increasingly compelled to adopt AM to remain competitive in the global economy. Despite its popularity, AM has several significant drawbacks, one of the most notable being its poor surface topography quality. Most product failures can be traced back to the initial surface conditions, making the surface texture a crucial factor in determining how well a product will perform. Hence, this thesis presents a study on the surface topography of various AM processes, mainly to understand the surface behavior in relation to the factors affecting it. Every manufacturing process, including AM, generates distinct surface features referred to as “footprints” or process signatures, which substantially affect the surface quality and function. These process signatures vary based on changes in AM processes and their process settings, materials, and geometrical design. The accuracy of identifying and analyzing these features becomes crucial in defining their relationship with manufacturing process variables. Usually, the best practice for defining surface quality is through parametric characterization, which provides a quantitative description of either the stochastic or deterministic nature of manufactured surfaces. However, the challenge with AM is that it generates surfaces that often contain both the aforementioned surface features, which make it particularly difficult to identify the manufacturing “footprints” through the parametric description. Therefore, the surface topography of AM may often require novel characterization methods to fully interpret the manufacturing process and thereby predict and optimize its product performance. The overall goal of this thesis is to provide an optimal approach toward the characterization of AM surfaces so that it gives a better understanding of the manufacturing process and also assists in process optimization to control the surface quality of the printed products. To realize this goal, the surface texture of AM processes was studied, particularly Material Extrusion (MEX), Vat Photopolymerization (VPP), and Powder Bed Fusion (PBF). These processes present topographical features that cover most of the surface scenarios in AM. Hence, to explain these varied surface features, a diverse range of surface characterization tools, such as Power Spectral Density (PSD), scale-sensitive fractal analysis, feature-based characterization, and quantitative characterization by both profile and areal surface texture parameters, were included in the analysis. Additionally, a methodology was developed using a statistical approach (linear multiple regression) and a combination of the above-mentioned characterization techniques to identify the most significant parameters for discriminating different surfaces. Finally, the knowledge gained through the above-mentioned measurements and analysis is put to use to optimize the AM process to achieve enhanced surface quality. The results suggest that the developed approaches can be used as a guideline for AM users who are looking to optimize the process for gaining better surface quality and component functionality, as it works effectively in finding the significant parameters representing the unique signatures of the manufacturing process.

Place, publisher, year, edition, pages
Gothenburg: Chalmers Univeristy of Technology, 2022. p. 93
Series
Thesis for the degree of Doctor of Philosophy, ISSN 0346-718X ; 5225
Keywords
additive manufacturing, vat-photopolymerization, fused deposition modeling, laser-based Powder bed fusion, surface metrology, power spectral density, scale-sensitive fractal analysis, featurebased characterization, profile parameters, areal surface texture parameters, and multiple regression.
National Category
Manufacturing, Surface and Joining Technology
Identifiers
urn:nbn:se:hh:diva-57967 (URN)978-91-7905-759-6 (ISBN)
Public defence
2022-12-15, Virtual Development Laboratory (VDL), Chalmers Tvärgata 4C, Campus Johanneberg, Gothenburg, 10:15 (English)
Opponent
Supervisors
Available from: 2026-02-10 Created: 2025-12-03 Last updated: 2026-02-10Bibliographically approved

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Vedantha Krishna, AmoghFlys, OlenaReddy, Vijeth VenkataramRosén, Bengt Göran

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