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Characterization of surface topography of a newly developed metrological gloss scale
Halmstad University, School of Business, Engineering and Science, Mechanical Engineering and Industrial Design (MTEK). SP Technical Research Institute of Sweden, Borås, Sweden.ORCID iD: 0000-0001-7501-8318
SP Technical Research Institute of Sweden, Borås, Sweden.
LCM LNE-Cnam, Trappes, France.
LCM LNE-Cnam, Trappes, France.
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2015 (English)In: Surface Topography: Metrology and Properties, ISSN 2051-672X, Vol. 3, no 4, 045001Article in journal (Refereed) Published
Abstract [en]

In the European Joint Research Project 'Multidimensional Reflectometry for Industry', a new gloss scale was developed with the aim to represent different levels of gloss, hue, roughness, and refractive indices. In this paper, the surfaces of six selected samples were thoroughly investigated using various measuring techniques in order to verify the outcome of the novel manufacturing processes in terms of distinct levels as well as types of surface roughness. The aim of the evaluation was to capture surface structures in different wavelength intervals utilizing a confocal microscope, a coherence scanning interferometer, and an atomic force microscope. Power spectral density functions were also calculated from the measurements and used to determine suitability of techniques for different roughness scales. The measurements show that the expected surface characteristics as well as different RMS roughness values are intimately connected to the perceived glossiness.

Place, publisher, year, edition, pages
Bristol: Institute of Physics (IOP), 2015. Vol. 3, no 4, 045001
Keyword [en]
surface topography, gloss, PSD
National Category
Engineering and Technology Electrical Engineering, Electronic Engineering, Information Engineering Production Engineering, Human Work Science and Ergonomics Nano Technology
Identifiers
URN: urn:nbn:se:hh:diva-30116DOI: 10.1088/2051-672X/3/4/045001ISI: 000364386300009Scopus ID: 2-s2.0-84979198389OAI: oai:DiVA.org:hh-30116DiVA: diva2:889977
Funder
EU, European Research Council
Note

This work was partially funded by the European Metrological Research Program (EMRP). The EMRP is jointly funded by the EMRP-participating countries with EURAMET and the European Union.

Available from: 2015-12-29 Created: 2015-12-29 Last updated: 2016-11-24Bibliographically approved

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CiteExportLink to record
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Cite
Citation style
  • apa
  • harvard1
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  • modern-language-association-8th-edition
  • vancouver
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Language
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