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Resistive switching in Cr-doped SrTiO3: An X-ray absorption spectroscopy study
Swiss Light Source, Paul Scherrer Institut, Villigen, Switzerland.ORCID iD: 0000-0002-3764-4235
Swiss Light Source, Paul Scherrer Institut, Villigen, Switzerland.
Swiss Light Source, Paul Scherrer Institut, Villigen, Switzerland.
IBM Research, Zurich Research Laboratory, Rüschlikon, Switzerland.
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2007 (English)In: Materials Science & Engineering: B. Solid-state Materials for Advanced Technology, ISSN 0921-5107, Vol. 144, no 1-3, 60-63 p.Article in journal (Refereed) Published
Abstract [en]

X-ray absorption spectroscopy was used to study the microscopic origin of conductance and resistive switching in chromium-doped strontium titanate (Cr:SrTiO3). Differences in the X-ray absorption near edge spectroscopy (XANES) at the Cr K-edge indicate that the valence of Cr changes from 3+ to 4+ underneath the anode of our sample device after the application of an electric field. Spatially resolved X-ray fluorescence microscopy (μ-XRF) maps show that the Cr4+ region retracts from the anode-Cr:SrTiO3 interface after a conducting state has been achieved. This interface region is studied with extended X-ray absorption fine structure (EXAFS) and the results are compared with structural parameters obtained from density functional theory (DFT) calculations. They confirm that oxygen vacancies which are localized at the octahedron with a Cr at its center are introduced at the interface. It is proposed that the switching state is not due to a valence change of chromium but caused by changes of oxygen vacancies at the interface. © 2007 Elsevier B.V. All rights reserved.

Place, publisher, year, edition, pages
Amsterdam: Elsevier, 2007. Vol. 144, no 1-3, 60-63 p.
Keyword [en]
Oxygen vacancies, Resistance switching, SrTiO3, Valence change, X-ray absorption spectroscopy (XAS)
National Category
Condensed Matter Physics
Identifiers
URN: urn:nbn:se:hh:diva-26527DOI: 10.1016/j.mseb.2007.07.059ISI: 000251744600013Scopus ID: 2-s2.0-35748967843OAI: oai:DiVA.org:hh-26527DiVA: diva2:747659
Conference
Symposium on Nanoscale Tailoring of Defect Structures for Optimized Functional and Multifunctional Oxide Films held at the EMRS 2007, Strasbourg, France, May 28-June 1, 2007
Available from: 2014-09-17 Created: 2014-09-17 Last updated: 2015-02-24Bibliographically approved

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