hh.sePublications
Change search
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf
The Stedman diagram revisited
Toponova AB, Halmstad, Sweden.
Halmstad University, School of Business, Engineering and Science, Mechanical Engineering and Industrial Design (MTEK).
Halmstad University, School of Business, Engineering and Science, Mechanical Engineering and Industrial Design (MTEK), Functional Surfaces. Manufacturing Technology Research Group, Department of Materials and Manufacturing Technology, Chalmers University, Göteborg, Sweden.ORCID iD: 0000-0001-8058-1252
2014 (English)In: Surface Topography : Metrology and Properties, ISSN 2051-672X, Vol. 2, no 1, 014005Article in journal (Refereed) Published
Abstract [en]

The Stedman diagram has been used for some years to display aspects of the performance of instruments measuring surface roughness. Such diagrams are herein employed to compare the features of a range of proprietary measuring instruments, including contact and non-contact devices. An extension of the basic diagram is proposed, which would allow it to include a further aspect: the speed of data collection. Figures of merit based on the revised diagram are computed, which enable instruments to be ranked on these particular aspects of their performance. Contact instruments emerge as comparable to non-contact, as their slower rate of data acquisition can be offset by the greater area they can access in amplitude–wavelength space. © 2014 IOP Publishing Ltd.

Place, publisher, year, edition, pages
Bristol: Institute of Physics (IOP), 2014. Vol. 2, no 1, 014005
National Category
Medical Laboratory and Measurements Technologies
Identifiers
URN: urn:nbn:se:hh:diva-25266DOI: 10.1088/2051-672X/2/1/014005Scopus ID: 2-s2.0-84979198601OAI: oai:DiVA.org:hh-25266DiVA: diva2:715168
Note

Special Issue: Selected papers from the 14th International Conference on Metrology and Properties of Engineering Surfaces (Met & Props 2013), held on 17–21 June 2013 Taipei, Taiwan

Available from: 2014-04-30 Created: 2014-04-30 Last updated: 2017-03-17Bibliographically approved

Open Access in DiVA

No full text

Other links

Publisher's full textScopus

Search in DiVA

By author/editor
Thomas, TomRosén, Bengt-Göran
By organisation
Mechanical Engineering and Industrial Design (MTEK)Functional Surfaces
Medical Laboratory and Measurements Technologies

Search outside of DiVA

GoogleGoogle Scholar

Altmetric score

Total: 220 hits
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf