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The Stedman diagram revisited
Toponova AB, Halmstad, Sweden.
Halmstad University, School of Business, Engineering and Science, Mechanical Engineering and Industrial Design (MTEK), Functional Surfaces.
Halmstad University, School of Business, Engineering and Science, Mechanical Engineering and Industrial Design (MTEK), Functional Surfaces. Chalmers University, Göteborg, Sweden.ORCID iD: 0000-0001-8058-1252
2013 (English)In: Metrology and Properties of Engineering Surfaces, 2013: Proceedings of the 14th International Conference, Taipei, Taiwan, June 17-21, 2013, 2013, 201-206 p.Conference paper, Published paper (Refereed)
Abstract [en]

The Stedman diagram has been used for some years to display aspects of the performance of surface roughness measuring instruments. Such diagrams are herein employed to compare the features of a range of proprietary measuring instruments, including contact and non-contact devices. An extension of the basic diagram is proposed which would allow it to include a further aspect, speed of data collection. Figures of merit based on the revised diagram are computed which enable instruments to be ranked on these particular aspects of their performance. Contact instruments emerge as comparable to non-contact, as their slower rate of data acquisition can be offset by the greater area they can access in amplitude-wavelength space.

Place, publisher, year, edition, pages
2013. 201-206 p.
National Category
Medical Laboratory and Measurements Technologies
Identifiers
URN: urn:nbn:se:hh:diva-25171OAI: oai:DiVA.org:hh-25171DiVA: diva2:714381
Conference
The 14th International Conference on Metrology and Properties of Engineering Surfaces, June 17-21, 2013, Taipei, Taiwan
Available from: 2014-04-28 Created: 2014-04-28 Last updated: 2017-04-19Bibliographically approved

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