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Fundamentals of Optical Measurement Systems: Part 2 - Measurement Systems
Halmstad University, School of Business and Engineering (SET), Mechanical Engineering and Industrial Design (MTEK), Fotonik.ORCID iD: 0000-0002-4826-019X
2012 (English)Conference paper, Published paper (Other academic)
Place, publisher, year, edition, pages
2012.
National Category
Mechanical Engineering
Identifiers
URN: urn:nbn:se:hh:diva-21126OAI: oai:DiVA.org:hh-21126DiVA: diva2:588355
Conference
2nd Seminar on Surface Metrology for the Americas 15-17 October 2012, Worcester Polytechnic Institute (WPI), Worcester MA, USA
Available from: 2013-01-15 Created: 2013-01-15 Last updated: 2013-11-15Bibliographically approved

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CiteExportLink to record
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Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
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  • asciidoc
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