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Multi-view and Multi-scale Recognition of Symmetric Patterns
Halmstad University, School of Information Technology, Halmstad Embedded and Intelligent Systems Research (EIS).
Halmstad University, School of Information Technology, Halmstad Embedded and Intelligent Systems Research (EIS).ORCID iD: 0000-0002-4929-1262
2009 (English)In: Image analysis / [ed] Arnt-Børre Salberg, Jon Yngve Hardeberg and Robert Jenssen, Berlin: Springer, 2009, p. 657-666Conference paper, Published paper (Refereed)
Abstract [en]

This paper suggests the use of symmetric patterns and their corresponding symmetry filters for pattern recognition in computer vision tasks involving multiple views and scales. Symmetry filters enable efficient computation of certain structure features as represented by the generalized structure tensor (GST). The, properties of the complex moments to changes in scale and multiple views including in-depth rotation of the patterns and the presence of noise is investigated. Images of symmetric patterns captured using a. low resolution low-cost CMOS camera, such as a phone Camera or a web-cam, from as far as three meters are precisely localized and their spatial orientation is determined from the argument of the second order complex moment I-20 without further computation.

Place, publisher, year, edition, pages
Berlin: Springer, 2009. p. 657-666
Series
Lecture Notes in Computer Science, ISSN 0302-9743 ; Vol. 5575
Keywords [en]
CMOS camera, Complex moments, Efficient computation, Low resolution, Multi-views, Multiple views, Multiscales, Second orders, Spatial orientations, Structure features, Structure tensors, Symmetric patterns, Symmetry filters
National Category
Computer Sciences
Identifiers
URN: urn:nbn:se:hh:diva-14943DOI: 10.1007/978-3-642-02230-2_67ISI: 000268661000067Scopus ID: 2-s2.0-70350629799ISBN: 978-3-642-02229-6 (print)OAI: oai:DiVA.org:hh-14943DiVA, id: diva2:408378
Conference
16th Scandinavian Conference on Image Analysis, SCIA 2009, Oslo, Norway, June 15-18, 2009
Available from: 2011-04-04 Created: 2011-04-04 Last updated: 2020-05-08Bibliographically approved

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Teferi, DerejeBigun, Josef

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CiteExportLink to record
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Citation style
  • apa
  • ieee
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Language
  • de-DE
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  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
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Output format
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