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Nanowire friction with an applied bias
Halmstad University, School of Information Science, Computer and Electrical Engineering (IDE), Halmstad Embedded and Intelligent Systems Research (EIS), MPE-lab. (Nanovetenskap)
Lund University, Solid State Physics, Box 118, 22100, Lund, Sweden. (Nanovetenskap)
Avd. f. Fasta Tillståndets Fysik, Lunds Universitet, Sweden. (Nanometerkonsortiet)
Avd. f. Fasta Tillståndets Fysik, Lunds Universitet, Sweden. (Nanometerkonsortiet)
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2010 (English)In: Bulletin of the American Physical Society: APS March Meeting 2010, Volume 55, Number 2, American Physical Society , 2010Conference paper, Poster (Refereed)
Abstract [en]

Recently, we have shown how the friction experienced by nanowires pushed by an AFM tip can be determined by measuring their radius of curvature after manipulation [1]. It is of fundamental interest to know whether the wires behave like macroscopic objects, or if they are more like true atomic-scale point contacts where friction becomes independent of the applied normal force. Here we study how the friction between InAs nanowires and a SiN layer on conductive silicon varies when a DC voltage is applied. The tip charges the capacitor formed by the wire and the silicon back contact, causing attractive Coulomb forces and so increasing the contact pressure. A monotonic increase of the sliding friction with voltage was observed. This implies that the friction increases with the normal force and that this mesoscopic system behaves more like a macroscopic contact, despite being only nanometers in size in the direction of motion.

Place, publisher, year, edition, pages
American Physical Society , 2010.
National Category
Physical Sciences
Identifiers
URN: urn:nbn:se:hh:diva-14189OAI: oai:DiVA.org:hh-14189DiVA: diva2:390867
Conference
American Physical Society, APS March Meeting 2010, March 15-19, Portland, USA, 2010
Note

Abstract ID: BAPS.2010.MAR.K1.150 ; Abstract: K1.00150

Available from: 2011-01-25 Created: 2011-01-24 Last updated: 2014-06-25Bibliographically approved

Open Access in DiVA

ABSTRACT01(80 kB)153 downloads
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File name ATTACHMENT01.pdfFile size 80 kBChecksum SHA-512
537deef2a2491c476a22a1d8a905c43b209a257db25f0a8b15d8b83e1769a8a3b5e840b53acb71abce37e0270bab1128c5004e1035ffc9bfd54a724159b248f5
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Other links

http://meetings.aps.org/link/BAPS.2010.MAR.K1.150

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