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Measuring homogeneity of planar point-patterns by using kurtosis
Halmstad University, School of Information Science, Computer and Electrical Engineering (IDE).
2000 (English)In: Pattern Recognition Letters, ISSN 0167-8655, E-ISSN 1872-7344, Vol. 21, no 13-14, p. 1149-1156Article in journal (Refereed) Published
Abstract [en]

Kurtosis is generally associated with measurements of peakedness of a distribution. In this paper, we suggest a method where kurtosis can be used as a measure of homogeneity of any quantifiable property on a planar surface. A 2-dimensional, continuous and uniform distribution has kurtosis equal to 5.6. This value is also the limiting value for a discrete uniform distribution defined on a regular, rectangular grid when the number of grid points tend to infinity. Measurements of a planar surface, taken at regular grid points, are considered as realizations of random fields. These are associated with 2-dimensional random variables from which the value of kurtosis can be computed and used as a measure of the homogeneity of the field. A deviation from 5.6 indicates that the stochastic variable is not uniformly distributed and that the corresponding random field is not homogeneous. The model is applied on the spatial variation of the roughness on the surface of newsprint, an application where homogeneity is very important.

Place, publisher, year, edition, pages
Amsterdam: Elsevier , 2000. Vol. 21, no 13-14, p. 1149-1156
National Category
Computer and Information Sciences
Identifiers
URN: urn:nbn:se:hh:diva-3431DOI: 10.1016/S0167-8655(00)00076-3ISI: 000165759000008Scopus ID: 2-s2.0-0034541122OAI: oai:DiVA.org:hh-3431DiVA, id: diva2:295183
Available from: 2010-02-17 Created: 2009-12-01 Last updated: 2018-03-23Bibliographically approved

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Johansson, Jan-Olof

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  • de-DE
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  • en-US
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  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
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