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Modelling the offset lithographic printing process
Halmstad University, School of Information Technology, Halmstad Embedded and Intelligent Systems Research (EIS), Intelligent systems (IS-lab).ORCID iD: 0000-0002-1043-8773
2006 (English)Licentiate thesis, comprehensive summary (Other academic)
Abstract [en]

A concept for data management and adaptive modelling of the offset lithographic printing process is proposed. Artificial neural networks built from historical process data are used to model the offset printing process aiming to develop tools for online ink flow control.

Inherent in the historical data are outliers owing to sensor faults, measurement errors and impurity of the materials used. It is fundamental to identify outliers in process data in order to avoid using these data points for updating the model. In this work, a hybrid the process-model-network-based technique for outlier detection is proposed. Several diagnosti measures are aggregated via a neural network to categorize the data points into the oulier or inlier classes. Experimentally it was demonstrated that a fuzzy expert can be configured to label data for training the categorization neural network.

A SOM based model combination strategy, allowing to create adaptive - data dependent - committees, is proposed to build models used for printing press initialization. Both, the number of models included into a committee and aggregation weights are specific for each input data point analyzed.

The printing process is constantly changing due to wear, seasonal changes, duration of print jobs etc. Consequently, models trained on historical data become out of date with time and need to be updated. Therefore, a data mining and adaptive modelling approach has been propsed. The experimental investigations performed have shown that the tools developed can follow the process changes and make appropriate adaptations of the ata set and the process models. A low process modelling error has been obtained by employing data dependent committees.

Place, publisher, year, edition, pages
Göteborg: Chalmers university of technology , 2006. , p. 73
Series
Technical report R, ISSN 1403-266X ; 2006:5
Keywords [en]
Neural networks, Self-organizing map, Data mining, Outlier detection, Leverages, Committee, Adaptive modelling
National Category
Computer graphics and computer vision
Identifiers
URN: urn:nbn:se:hh:diva-1966Local ID: 2082/2361OAI: oai:DiVA.org:hh-1966DiVA, id: diva2:239184
Presentation
(English)
Available from: 2008-09-26 Created: 2008-09-26 Last updated: 2025-02-07Bibliographically approved

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Englund, Cristofer

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CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf