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SAFEXPLAIN: Safe and Explainable Critical Embedded Systems Based on AI
Barcelona Supercomputing Center, Barcelona, Spain.
Ikerlan Technology Research Centre, Arrasate, Spain.
RISE Research Institutes of Sweden, Gothenburg, Sweden.ORCID iD: 0000-0002-1043-8773
Navinfo Europe, Eindhoven, Netherlands.
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2023 (English)In: DATE 23: Design, Automation And Test In Europe: The European Event For Electronic System Design & Test, 2023, p. 1-6Conference paper, Published paper (Refereed)
Abstract [en]

Deep Learning (DL) techniques are at the heart of most future advanced software functions in Critical Autonomous AI-based Systems (CAIS), where they also represent a major competitive factor. Hence, the economic success of CAIS industries (e.g., automotive, space, railway) depends on their ability to design, implement, qualify, and certify DL-based software products under bounded effort/cost. However, there is a fundamental gap between Functional Safety (FUSA) requirements on CAIS and the nature of DL solutions. This gap stems from the development process of DL libraries and affects high-level safety concepts such as (1) explainability and traceability, (2) suitability for varying safety requirements, (3) FUSA-compliant implementations, and (4) real-time constraints. As a matter of fact, the data-dependent and stochastic nature of DL algorithms clashes with current FUSA practice, which instead builds on deterministic, verifiable, and pass/fail test-based software. The SAFEXPLAIN project tackles these challenges and targets by providing a flexible approach to allow the certification - hence adoption - of DL-based solutions in CAIS building on: (1) DL solutions that provide end-to-end traceability, with specific approaches to explain whether predictions can be trusted and strategies to reach (and prove) correct operation, in accordance to certification standards; (2) alternative and increasingly sophisticated design safety patterns for DL with varying criticality and fault tolerance requirements; (3) DL library implementations that adhere to safety requirements; and (4) computing platform configurations, to regain determinism, and probabilistic timing analyses, to handle the remaining non-determinism. © 2023 EDAA.

Place, publisher, year, edition, pages
2023. p. 1-6
Series
Design, Automation and Test in Europe (DATE), ISSN 1530-1591, E-ISSN 1558-1101
Keywords [en]
Deep learning, Embedded systems, Product design, Software testing, Stochastic systems
National Category
Computer Systems
Identifiers
URN: urn:nbn:se:hh:diva-52952DOI: 10.23919/date56975.2023.10137128ISI: 001027444200173Scopus ID: 2-s2.0-85162662708&ISBN: 978-3-9819263-7-8 (print)OAI: oai:DiVA.org:hh-52952DiVA, id: diva2:1846517
Conference
The 26th DATE conference, Antwerp, Belgium, 17- 19 April, 2023
Funder
EU, Horizon Europe, 101069595
Note

The research leading to these results has received funding from the Horizon Europe Programme under the SAFEXPLAIN Project (www.safexplain.eu), grant agreement num. 101069595. BSC authors have also been supported by the Spanish Ministry of Science and Innovation under grant PID2019-107255GBC21/AEI/10.13039/501100011033

Available from: 2024-03-22 Created: 2024-03-22 Last updated: 2024-03-26Bibliographically approved

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Englund, Cristofer

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