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Digital Forensic Atomic Force Microscopy of Semiconductor Memory Arrays
Halmstad University, School of Information Technology, Halmstad Embedded and Intelligent Systems Research (EIS), Centre for Research on Embedded Systems (CERES).
Norwegian University of Science and Technology, Gjovik, Norway.
2019 (English)In: Advances in Digital Forensics XV: 15th IFIP WG 11.9 International Conference, Orlando, FL, USA, January 28–29, 2019, Revised Selected Papers, Cham: Springer, 2019, p. 219-237Conference paper, Published paper (Refereed)
Abstract [en]

Atomic force microscopy is an analytical technique that provides very high spatial resolution with independent measurements of surface topography and electrical properties. This chapter assesses the potential for atomic force microscopy to read data stored as local charges in the cells of memory chips, with an emphasis on simple sample preparation (“delidding”) and imaging of the topsides of chip structures, thereby avoiding complex and destructive techniques such as backside etching and polishing. Atomic force microscopy measurements of a vintage EPROM chip demonstrate that imaging is possible even when sample cleanliness, stability and topographical roughness are decidedly sub-optimal. As feature sizes slip below the resolution limits of optical microscopy, atomic force microscopy offers a promising route for functional characterization of semiconductor memory structures in RAM chips, microprocessors and cryptographic hardware. © IFIP International Federation for Information Processing 2019. Published by Springer Nature Switzerland AG 2019

Place, publisher, year, edition, pages
Cham: Springer, 2019. p. 219-237
Series
IFIP Advances in Information and Communication Technology, ISSN 1868-4238, E-ISSN 1868-422X ; 569
Keywords [en]
Atomic force microscopy, memory chip delidding, surface imaging
National Category
Other Computer and Information Science
Identifiers
URN: urn:nbn:se:hh:diva-41118DOI: 10.1007/978-3-030-28752-8_12Scopus ID: 2-s2.0-85071508585Libris ID: 4f0xg3lp2n0scqk3ISBN: 978-3-030-28752-8 (electronic)ISBN: 978-3-030-28751-1 (print)OAI: oai:DiVA.org:hh-41118DiVA, id: diva2:1375294
Conference
15th IFIP WG 11.9 International Conference, Orlando, FL, USA, January 28–29, 2019
Available from: 2019-12-04 Created: 2019-12-04 Last updated: 2020-01-10Bibliographically approved

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Gray, StruanAxelsson, Stefan

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CiteExportLink to record
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