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Learning-Based Local-Patch Resolution Reconstruction of Iris Smart-phone Images
Halmstad University, School of Information Technology, Halmstad Embedded and Intelligent Systems Research (EIS), CAISR - Center for Applied Intelligent Systems Research.ORCID iD: 0000-0002-1400-346X
University of Malta, Msida, Malta.
Halmstad University, School of Information Technology, Halmstad Embedded and Intelligent Systems Research (EIS), CAISR - Center for Applied Intelligent Systems Research.ORCID iD: 0000-0002-4929-1262
2017 (English)Conference paper, Published paper (Refereed)
Abstract [en]

Application of ocular biometrics in mobile and at a distance environments still has several open challenges, with the lack quality and resolution being an evident issue that can severely affects performance. In this paper, we evaluate two trained image reconstruction algorithms in the context of smart-phone biometrics. They are based on the use of coupled dictionaries to learn the mapping relations between low and high resolution images. In addition, reconstruction is made in local overlapped image patches, where up-scaling functions are modelled separately for each patch, allowing to better preserve local details. The experimental setup is complemented with a database of 560 images captured with two different smart-phones, and two iris comparators employed for verification experiments. We show that the trained approaches are substantially superior to bilinear or bicubic interpolations at very low resolutions (images of 13×13 pixels). Under such challenging conditions, an EER of ∼7% can be achieved using individual comparators, which is further pushed down to 4-6% after the fusion of the two systems. © 2017 IEEE

Place, publisher, year, edition, pages
New York: IEEE, 2017. p. 787-793
National Category
Signal Processing
Identifiers
URN: urn:nbn:se:hh:diva-34687DOI: 10.1109/BTAS.2017.8272771ISI: 000426973200097Scopus ID: 2-s2.0-85046260527ISBN: 978-1-5386-1124-1 (electronic)ISBN: 978-1-5386-1125-8 (print)OAI: oai:DiVA.org:hh-34687DiVA, id: diva2:1129962
Conference
IEEE/IAPR International Joint Conference on Biometrics, IJCB, Denver, Colorado, USA, October 1-4, 2017
Projects
SIDUS-AIR
Funder
Swedish Research Council, 2012-4313Knowledge Foundation, SIDUS-AIRKnowledge Foundation, CAISRAvailable from: 2017-08-08 Created: 2017-08-08 Last updated: 2018-06-04Bibliographically approved

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Alonso-Fernandez, FernandoBigun, Josef

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CiteExportLink to record
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Cite
Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
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  • Other locale
More languages
Output format
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  • text
  • asciidoc
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