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Digital Forensic Atomic Force Microscopy of Semiconductor Memory Arrays
Högskolan i Halmstad, Akademin för informationsteknologi, Halmstad Embedded and Intelligent Systems Research (EIS), Centrum för forskning om inbyggda system (CERES).
Norwegian University of Science and Technology, Gjovik, Norway.
2019 (engelsk)Inngår i: Advances in Digital Forensics XV: 15th IFIP WG 11.9 International Conference, Orlando, FL, USA, January 28–29, 2019, Revised Selected Papers, Cham: Springer, 2019, s. 219-237Konferansepaper, Publicerat paper (Fagfellevurdert)
Abstract [en]

Atomic force microscopy is an analytical technique that provides very high spatial resolution with independent measurements of surface topography and electrical properties. This chapter assesses the potential for atomic force microscopy to read data stored as local charges in the cells of memory chips, with an emphasis on simple sample preparation (“delidding”) and imaging of the topsides of chip structures, thereby avoiding complex and destructive techniques such as backside etching and polishing. Atomic force microscopy measurements of a vintage EPROM chip demonstrate that imaging is possible even when sample cleanliness, stability and topographical roughness are decidedly sub-optimal. As feature sizes slip below the resolution limits of optical microscopy, atomic force microscopy offers a promising route for functional characterization of semiconductor memory structures in RAM chips, microprocessors and cryptographic hardware. © IFIP International Federation for Information Processing 2019. Published by Springer Nature Switzerland AG 2019

sted, utgiver, år, opplag, sider
Cham: Springer, 2019. s. 219-237
Serie
IFIP Advances in Information and Communication Technology, ISSN 1868-4238, E-ISSN 1868-422X ; 569
Emneord [en]
Atomic force microscopy, memory chip delidding, surface imaging
HSV kategori
Identifikatorer
URN: urn:nbn:se:hh:diva-41118DOI: 10.1007/978-3-030-28752-8_12Scopus ID: 2-s2.0-85071508585Libris ID: 4f0xg3lp2n0scqk3ISBN: 978-3-030-28752-8 (digital)ISBN: 978-3-030-28751-1 (tryckt)OAI: oai:DiVA.org:hh-41118DiVA, id: diva2:1375294
Konferanse
15th IFIP WG 11.9 International Conference, Orlando, FL, USA, January 28–29, 2019
Tilgjengelig fra: 2019-12-04 Laget: 2019-12-04 Sist oppdatert: 2020-01-10bibliografisk kontrollert

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