The work describes the development of a reliable device for profiling anion beam in the intensity cross section. A sensor head consisting of a Faradaycup in combination with a Channel Electron Multiplier was designedand built together with electronics including power supply and front endelectronics. The design was chosen considering financial and long term lifeaspects. Testing, first calibration and error analysis were done using the ionbeam facilities where the unit is supposed to be installed permanently. Theprofiling system performed as designed and the profile of the ion beam couldbe measured reliably with an accuracy down to the femto ampere range.